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Agilent E6832A W-CDMA Calibration Application
For the E6601A Wireless Communications Test Set
Data Sheet
The next generation of mobile phone manufacturing test.
E6601A is the newest test set from Agilent Technologies, designed especially for high-volume, test-mode manufacturing. Combining industry-leading measurement speed, selectable formats, flexible licensing, and an integrated open Windows(R) XP PC, the E6601A helps you achieve the lowest cost of test in mobile phone manufacturing. The E6601A and its available technology-specific software applications deliver industry leading measurement speed and accuracy for your mobile phone test needs. The Agilent E6832A W-CDMA Calibration Application is a non-signaling application optimized for W-CDMA and HSDPA mobile phone calibration. The E6832A also provides a choice of perpetual, transportable, or term licenses for maximizing asset utilization and your cost per test. The test set and its applications use emerging advancements such as fast device tune features to deliver fast, high-quality calibration. Because it's Agilent, you can be confident--it operates using trusted, proven measurement methodology that ensures measurement integrity that is never compromised.
E6601A/E6890A Features and General Specifications
* * * * * * * * * * * * CW, AM, FM, DSB-SC source modulation RF analyzer Spectrum monitor Transmitter power measurements Power versus time measurement Frequency error measurement Optional IQ capture waveform sampling Internal OCXO timebase Built-in open Windows XP PC Built-in help system Run test programs with internal or external PC GPIB, USB, and LAN connectivity and control
E6832A Features
Source modulation * CW, amplitude, frequency, W-CDMA Power measurements * Mean power * Root-raised cosine power Spectral measurements * Spectrum emission mask * Adjacent channel leakage * Spectrum monitor
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Modulation quality * CW frequency error * DPCH EVM, OBW, frequency error
Technical Specifications
These specifications apply to an E6601A mainframe and the E6832A W-CDMA Calibration Application firmware revision A.04 or higher. Only feature additions beyond the E6890A General Purpose Application are included in this document. Specifications describe the test set's warranted performance and are valid for the unit's operation within 10 C of the last self alignment. All specifications are valid after a 30-minute warm-up period of continuous operation with valid self alignment. If the instrument has been off for longer than 48 hours, a 48-hour warm-up period followed by self alignment is required. Supplemental characteristics are intended to provide typical, but non-warranted, performance parameters that may be useful in applying the instrument. These characteristics are shown in italics and labeled as "typical." All units shipped from the factory meet these typical numbers at +25 C ambient temperature without including measurement uncertainty.
RF Generator
Frequency
W-CDMA cellular bands Band I IMT-2000 Band II U.S. PCS Band III DCS/PCS Band IV Band V U.S. Cellular Band VI UMTS800 Band VII UMTS2600 Band VIII UMTS900 Band IX UMTS1700 Band X UMTS Extended Band XI UMTS1500 2112 to 2168 MHz 1932 to 1988 MHz 1807 to 1878 MHz 2112 to 2153 MHz 871 to 892 MHz 877 to 883 MHz 2620 to 2690 MHz 927 to 958 MHz 1844 to 1880 MHz 2110 to 2170 MHz 1475.9 to 1500.9 MHz
Output level
Signal level is measured using a root-raised cosine (RRC) filter with a roll-off a = 0.22 and a 3.84 MHz bandwidth. Output level renges RF IN/OUT port RF OUT ONLY port -115 to -13 dBm/3.84 MHz -115 to -5 dBm/3.84 MHz
Composite signal absolute level accuracy (< 10 C and < 24 hours from last self alignment, -108 to -15 dBm / 3.84 MHz) RF IN/OUT port RF OUT ONLY port QPSK modulation Residual EVM < 1.0 dB, typically < 0.65 dBm < 1.0 dB, typically < 0.65 dBm Typically < 3%
RF Analyzer
Frequency
W-CDMA cellular bands Band I IMT-2000 Band II U.S. PCS Band III DCS/PCS Band IV Band V U.S. Cellular Band VI UMTS800 Band VII UMTS2600 Band VIII UMTS900 Band X UMTS Extended Band XI UMTS1500 Band IX UMTS1700 Input level ranges Average power Peak power Self alignment validity 1922 to 1978 MHz 1852 to 1908 MHz 1712 to 1783 MHz 1712 to 1753 MHz 826 to 847 MHz 832 to 838 MHz 2500 to 2570 MHz 882 to 913 MHz 1710 to 1770 MHz 1427.9 to 1452.9 MHz 1749 to 1785 MHz -65 to +28 dBm/3.84 MHz -65 to +37 dBm/3.84 MHz (5 W) 10 C change and 30 days from last self alignment
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DPCH Measurement Suite
Includes mean and RRC-filtered mean power, spectrum emission mask, ACLR, composite EVM frequency error, PCDE, and occupied bandwidth measurements. Trigger setup Delay Sources -20 to +20 ms External, fall, immediate, rise
Adjacent channel leakage ratio (ACLR) measurement
This measurement provides a ratio of the filtered mean transmitted power to the filtered mean power in an adjacent channel. Both the transmitted and the adjacent channel powers are measured with a filter that has an RRC response with roll-off a = 0.22 and a bandwidth equal to the chip rate. Input level range Average power Measurement accuracy 5 MHz offsets at -33 dB 10 MHz offsets at -43 dB Residual noise floor 5 MHz offsets 10 MHz offsets Filter +5 to +28 dBm/3.84 MHz < 0.8 dB, typically < 0.4 dB < 0.8 dB, typically < 0.4 dB Typically < -53 dBc Typically < -63 dBc 3.84 MHz (RRC)
Mean and RRC-filtered mean power measurements
Input level range Average power -61 to +28 dBm/3.84 MHz
Measurement accuracy -54 to +28 dBm/3.84 MHz < 0.6 dB, typically < 0.3 dB -61 to < -54 dBm/3.84 MHz < 0.7 dB, typically < 0.4 dB With < 48 hours warm-up before self alignment initiated -54 to +28 dBm/3.84 MHz < 0.7 dB, typically < 0.3 dB -61 to < -54 dBm/3.84 MHz < 0.8 dB, typically < 0.4 dB Measurement repeatability Filter Mean power RRC-filtered mean power Typically < 0.05 dB Mean power-compliant filter 3.84 MHz
Error vector magnitude (EVM) measurement
This measurement calculates composite EVM and several other results relating to UE modulation quality. Input level range Average power UE ranges EVM Frequency error Timing error -25 to +28 dBm/3.84 MHz 35% rms < 1 kHz < 50 chips
Spectrum emission mask (SEM) measurement
This measurement provides a ratio of the transmitted power in a 3.84 MHz RRC bandwidth to offset frequencies, which are between 2.5 MHz and 12.5 MHz away from the UE carrier frequency. Input level range Average power Measurement accuracy 2.5 to 12.5 MHz +5 to +28 dBm/3.84 MHz < 1.5 dB, typically < 0.5 dB
EVM measurement accuracy (Includes residual EVM) UE EVM 0% rms < 2.5% rms UE EVM 17.5% rms < 0.7% rms UE EVM 35% rms < 0.5% rms Filter Measurement results 3.84 MHz (RRC) EVM, magnitude error, phase error, origin offset
Offset frequency measurement bandwidths 2.5 to 3.5 MHz offsets 30 kHz 3.5 to 12.5 MHz offsets 1 MHz In-band measurement filter 3.84 MHz (RRC)
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1. Additional accuracy error when using RF OUT ONLY port is < 0.1 dB.
3
Frequency error measurement
Input level range Average power UE ranges EVM Frequency error Timing error Filter Measurement accuracy -25 to +28 dBm/3.84 MHz 35% rms < 1 kHz < 50 chips 3.84 MHz (RRC) < (5 Hz + timebase accuracy)
Dynamic Power Measurement
Input level range Average power Amplitude capture range With 4 dB crest factor -61 to +28 dBm/3.84 MHz < 2 dB of expected power
Measurement accuracy +2 to -45 dB of expected power -54 to +28 dBm/3.84 MHz < 0.6 dB, typically < 0.3 dB -61 to < -54 dBm/3.84 MHz < 0.7 dB, typically < 0.4 dB +2 to -45 dB of expected power with < 48 hours warm-up before self alignment initiated -54 to +28 dBm/3.84 MHz < 0.7 dB, typically < 0.3 dB -61 to < -54 dBm/3.84 MHz < 0.8 dB, typically < 0.4 dB Measurement repeatability Returning to same level and frequency, no temperature change and insignificant time change Trigger setup Sources Filters Typically < 0.05 dB
Peak code domain error (PCDE) measurement
Input level range Average power UE ranges EVM Frequency error Timing error Filter Measurement accuracy -25 to +28 dBm/3.84 MHz 35% rms < 1 KHz < 50 chips 3.84 MHz (RRC) < 0.3 dB
External, fall, rise 1 kHz 30 kHz 100 kHz 300 kHz 640 kHz 1.23 MHz 1.28 MHz 1.6 MHz 3.84 MHz 5.0 MHz 8PSK estimated carrier power GSM Tx power W-CDMA mean power
Occupied bandwidth (OBW) measurement
This measurement calculates the bandwidth containing 99.0% of the total integrated power of the transmitted signal, centered on the channel frequency. Input level range Average power Measurement accuracy +5 to +28 dBm/3.84 MHz < 60 kHz at 99.0% total integrated power
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1. Additional accuracy error when using RF OUT ONLY port is < 0.1 dB.
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Fast Device Tune Measurement
Allows simultaneous calibration of a device's transmitter output power and receiver input level across level and frequency in a single sweep (per frequency band). The device must operate in a test mode, which forces it to transmit a predefined series of power steps at various uplink frequencies, and also forces it to simultaneously tune its receiver to perform measurements (such as RSSI) of the test set's signal at various downlink frequencies and power levels. Input level range Average Tx power Measurement interval Measurement filter -61 to +28 dBm/3.84 MHz 1 timeslot (667 s) W-CDMA mean power
Power measurement accuracy 0 to -45 dB of expected power and 20 to 55 C -54 to +28 dBm/3.84 MHz < 0.75 dB, typically < 0.4 dB -61 to < -54 dBm/3.84 MHz < 0.85 dB, typically < 0.5 dB 0 to -45 dB of expected power and 20 to 55 C with 48-hours warm-up before self alignment initiated -54 to +28 dBm/3.84 MHz < 0.85 dB, typically < 0.4 dB -61 to < -54 dBm/3.84 MHz < 0.95 dB, typically < 0.5 dB Output level ranges (Rx level at) RF IN/OUT port -108 to -15 dBm/3.84 MHz RF OUT ONLY port -108 to -5 dBm/3.84 MHz Composite signal absolute output level accuracy (< 10 C and < 24 hours from last self alignment) -108 to -15 dBm/ < 1.0 dB, typically < 0.65 dBm 3.84 MHz at RF IN/OUT port -108 to -5 dBm/ < 1.0 dB, typically < 0.65 dBm 3.84 MHz at RF OUT ONLY port Output level settling (Rx level within 0.1 dB) Amplitude switch Step size range Trigger setup Sources < 1 ms, typically < 250 s 5 to 20 ms Immediate, rise Frequency switch within band < 1 ms, typically < 500 s
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1. Additional accuracy error when using RF OUT ONLY port is < 0.1 dB.
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Revised: October 24, 2007
Windows XP is a U.S. registered trademark of Microsoft Corporation. Product specifications and descriptions in this document subject to change without notice. (c) Agilent Technologies, Inc. 2006, 2007 Printed in USA, December 6, 2007 5989-5294EN
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